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Chemical Analysis by X-ray Flourescence Spectrometer

Chemical analysis by XRF is conducted for a wide range of purposes from material identification and characterisation to quality control monitoring. XRF is a method for measuring elemental contents of samples. The basic principle of XRF involves irradiating the sample with incident X-rays and measuring the secondary X-rays emitted which is characteristic of each element.

X-Ray Fluorescence Spectrophotometer

Typical Analytes
  • SiO2, Al2O3, TiO2, Fe2O3, Na2O, K2O, CaO, MgO
Typical Materials
  • Ceramics (tiles, pottery, tableware, sanitaryware)
  • Raw materials (clay, sand, feldspar, limestone,
    pottery stone...etc)
  • Refractories